September 1st 2016In this paper, we examine the relative performance of 532 and 785 nm portable Raman systems, as well as demonstrate an automated analytical methodology applicable for carbon nanotube (CNT) characterization and quality control applications. Both 532 and 785 nm Raman spectra were used to directly analyze and compare important CNT structural parameters and properties including CNT diameters, diameter distributions, CNT structural quality (% of defects), CNT types, and other properties. The data indicate advantages in a number of areas for using 532 versus 785 nm excitation for CNT Raman measurements.