Dr. Derek Nowak discusses PiFM, an AFM-IR-based technique, to explain how IR spectroscopy and imaging can be extended to the nanoscale. With sub 5 nm lateral resolution and single-molecule-level sensitivity, PiFM opens up a wide variety of research avenues ranging from exploring nano-crystallin structures for drug delivery to process/failure analysis in semiconductor nanofabrication.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
New Probes for NIR Monitoring of Polymer Injection Molding Composition in Real-Time
May 2nd 2024Researchers from Kyoto University and Japan's National Institute of Advanced Industrial Science and Technology have developed innovative probes to monitor the chemical composition of biodegradable polymer blends during injection molding. This breakthrough could lead to improved production efficiency and reduced waste in the polymer industry.