May 3rd 2024
A recent study discusses the recent upgrades to the infrared (IR) beamline at BESSY II storage ring, which has helped it improve its results when conducting IR microscopy.
Basic Fundamental Parameters in X-Ray Fluorescence
May 1st 2007The "fundamental parameters" approach to calibration in X-ray fluorescence is unique because it is based upon the theoretical relationship between measured X-ray intensities and the concentrations of elements in the sample. This theoretical relationship is based upon X-ray physics and the measured values of fundamental atomic parameters in the X-ray region of the electromagnetic spectrum. In this tutorial, an introduction to the means of calibration is provided based upon a simplified instrument–sample geometry, thus eliminating some of the mathematical details of the traditional derivations.
An Overview of New Products at the Denver X-ray Conference (PDF)
July 1st 2003This article provides a brief overview of some of the latest spectroscopy-related equipment and supplies scheduled to be introduced at the 2003 Denver X-ray Conference at the Denver Marriott Tech Center Hotel in Denver, Colorado, August 4?8, 2003.