Raman Spectroscopy for Identification of Contaminant Materials in Pharmaceuticals
June 1st 2016Raman spectroscopy is particularly useful for identification of contaminant materials in pharmaceuticals because it can very clearly and nondestructively identify materials. Raman spectroscopy can be used to identify foreign matter on tablets as well as the individual tablet materials to confirm the material’s legitimacy. For injectable drug vials, Raman spectroscopy can be used with microscopy to count, size, and identify particulate contamination found in such vials. Spectral interpretation is key to the value of Raman spectroscopy, and it is important for accuracy of identification not to simply rely on library match values.
Evaluation of Eye Shadow Compounds Using Raman Microspectroscopy
June 1st 2016Cosmetic preparations are common consumer products that consist of various organic and inorganic materials. In this paper, a method for the identification and spatial discrimination of the components in eye shadow samples using laser Raman microspectroscopy is described. The use of a multivariate curve resolution (MCR) is utilized during the analysis of the cosmetic preparation mapping data to develop the spatial discrimination information presented within this note.
Raman Spectroscopy as a Tool for Analytical Quality Control in a Hospital Environment
June 1st 2016Analytical quality control (AQC) is an established application of Raman spectroscopy in many industrial fields. The extension of Raman spectroscopy as an AQC method in hospital environments imparts the benefits of a noninvasive and nondestructive analysis. The literature in using Raman spectroscopy as an AQC method for chemotherapy preparation and anesthesia gas monitoring is reviewed. Future applications in tissue engineering and incorporating new Raman techniques into AQC are also discussed.
Polarized Raman Spectroscopy of Aligned Semiconducting Single-Walled Carbon Nanotubes
June 1st 2016Aligned semiconducting single-walled carbon nanotubes (s-SWCNTs) are expected to outperform silicon as the next generation of integrated circuits. Greater utilization of polarized Raman spectroscopy is proving beneficial for efficient characterization of alignment in CNT films. Here, we present the results of how polarized Raman imaging can be used to effectively characterize alignment in large regions of aligned s-SWCNT films.