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FT-IR Microscopy, Part 2: Mid-IR Sampling with DRIFTS, IRRAS, and ATR

February 14th 2025

Fourier transform infrared (FT-IR) microscopy using reflection methods (diffuse reflection, reflection/reflection-absorption, or attenuated total reflectance) typically requires less sample preparation than transmission. However, optimal results will depend upon the sample and, in particular, the sample surface.

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Key Points to Remember When Using Internal Standards for Sample Analysis by ICP-OES

August 2nd 2023

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Non-Specific Calibration Combined with Helium Collision Mode for Elemental Screening

August 2nd 2023

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Understanding the Limits of the Bouguer-Beer-Lambert Law

August 1st 2023

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A Brief Look at Optical Diffuse Reflection (ODR) Spectroscopy

August 1st 2023

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