Michael S. Bradley

Fourier transform infrared (FT-IR) microscopy using reflection methods (diffuse reflection, reflection/reflection-absorption, or attenuated total reflectance) typically requires less sample preparation than transmission. However, optimal results will depend upon the sample and, in particular, the sample surface.

In this tutorial, we examine the techniques for preparing samples for transmission analysis using single windows, compression cells, and, finally, epoxy “pucks” and microtomes.

Our annual review of new products for atomic and molecular spectroscopy, including details by category and highlights of overarching trends.

Our annual review of new products for atomic and molecular spectroscopy, including details by category and highlights of overarching trends.

Measurements of the optical proper ties of a ceramic material, Z93, which is in current use on the International Space Station (ISS), reveal why this material is successful for thermal control in the ISS implementation, and also point to potential future material design improvements.

Our annual review of products introduced at Pittcon or during the previous year.