Application Notes: Atomic Spectroscopy
Ultra-Trace Metal Detection in Cathodes with ICP-MS
ICP-MS offers ultra-sensitive metal impurities analyses in LiBs cathodes, with the NexION® 1100 ICP-MS helping meet stricter quality standards for better battery performance.
Additives in LiBs Cathode Materials by ICP-OES
Additives are often utilized to enhance Li-ion battery performance. The Avio® 550 Max ICP-OES provides a suitable test method for additives to Li-ion battery cathodes.
Analysis for Sodium-Ion Batteries Cathode Materials by ICP-OES
SiBs are a safer, cheaper, greener alternative to LiBs. PerkinElmer's Avio® 550 Max ICP-OES ensures precise, efficient analysis of SiBs cathode materials.
Solid-State Batteries Materials Analysis Infographic
Advanced laboratory solutions enable the development of safer, lighter solid-state batteries, driving EV innovation and supporting the renewable energy shift.
Emerging Trends in Battery Technologies
This white paper discusses the key trends, challenges, and potential of emerging battery technologies like solid-state, Li-ion, Na-ion, and recycling advancements.
Elemental Impurities in Solid Electrolytes by ICP-OES
Solid electrolytes boost Li-ion battery safety and performance. PerkinElmer's Avio® 220 Max ICP-OES ensures precise impurity control below 0.1% for optimal results.
Lithium-to-Cathode Ratio Analysis in High-Nickel LiBs by ICP-OES
EV demand is growing, boosting Li-ion battery use. The Avio® 550 Max ICP-OES provides accurate, repeatable determinations of the molar ratio of Li to sum of metals in NCMA.
Optimizing Sintering Process of Solid-State Electolyte
TMA and STA technologies allow in-situ monitoring of the sintering process of solid electrolyte powders, optimizing solid-state battery performance.
Compositional Depth Profile Analysis of Galvanized Steel (May 2025)
Compositional Depth Profile (CDP) using the LECO GDS950 rapidly provides analysis of various galvanized coatings on steel.
Elemental Analysis of Serum Using the NexION 5000 ICP-MS
ICP-MS is the top choice for trace element analysis in bodily fluids. The NexION® 5000 ensures fast, precise detection in serum with simple sample prep.
Testing and Validation of Elemental Impurities in Pharmaceuticals per ICH Q3D and USP <232>/<233> with NexION 1100 ICP-MS
USP and ICH Q3D set strict limits for elemental impurities in drugs. The NexION® 1100 ICP-MS ensures accurate, interference-free analysis of pharmaceutical products.
Analysis of Metallic Impurities in Carbon Monoxide Gas by Gas Direct Injection - ICP-MS
Controlling metal impurities in CO is vital for semiconductor fabrication. The NexION® 2200 ICP-MS with gas direct injection (GDI) enables faster, more sensitive analysis.
Direct Determination of Trace Elements in Tungsten Hexacarbonyl with the NexION 1100 ICP-MS
Trace impurities in tungsten hexacarbonyl must be measured precisely. The NexION® 1100 ICP-MS eliminates interferences, enabling accurate multi-element analysis.
Elemental Analysis of Urine Using the NexION 5000 ICP-MS
ICP-MS is the go-to for detecting trace elements in bodily fluids. The NexION® 5000 makes urine analysis easy and precise with simple dilution—no digestion needed!
Analysis of Ultra-Trace Elements in Semiconductor-Grade Organic Solvents with the NexION 2200 ICP-MS
Ultra-pure NMP is essential in semiconductor fabrication. The NexION® 2200 ICP-MS enables precise, interference-free trace metal analysis, ensuring high-purity standards.
Analysis of Silicon Isotope Ratios Using the NexION 5000 ICP-MS
Si isotope analysis reveals insights into geological and biological processes. The NexION® 5000 ICP-MS offers high sensitivity, accuracy, and stability for precise ratio measurements.
Analysis of Elemental Impurities in Semiconductor-Grade Hydrochloric Acid with the NexION 2200 ICP-MS
Ultra-high-purity HCl is crucial in semicon wafer cleaning. The NexION® 2200 ICP-MS accurately quantifies ultra-trace impurities, minimizing interferences and sample prep.
Unlocking Innovation in Life Science R&D with Advanced Semantic Integration
In BioTech R&D, overcoming data fragmentation is crucial as it hinders innovation, leads to redundant efforts, and wastes resources.
Metallic Impurity Analysis in Ultra-Pure NMP by Multi-Quad ICP-MS
See how the NexION® 5000 multi-quad ICP-MS offers exceptional performance and interference removal for trace metallic impurities in ultra-pure N-methyl-2-pyrrolidone.
Smart, Sustainable Electronic Board Recycling with ICP-MS and ICP-OES
Camston Wrather is transforming waste disposal with sustainable resource recovery from PCBs. Partnering with PerkinElmer, they’ve advanced eco-friendly solutions.
Ultra-Trace Elemental Analysis of Semiconductor Solvents by ICP-MS
For the analysis of semiconductor-grade solvents, see how the NexION® 2200 ICP-MS accurately quantifies ppt-level impurities by reducing polyatomic interferences.
Metallic Nanoparticle Analysis in Semiconductor-Grade H2SO4 by Multi-Quad SP-ICP-MS
In semiconductor fabrication, controlling impurities is crucial. This work describes metallic nanoparticle analysis in sulfuric acid using the NexION® 5000 SP-ICP-MS.
Analysis of Metallic Nanoparticles in TMAH by Multi-Quad SP-ICP-MS
Explore a method for ultratrace-level quantification of nanoparticle impurities in semiconductor-grade TMAH using NexION® 5000 ICP-MS for improved yield and performance.
Elemental Impurity Analysis in Semiconductor HCl by ICP-MS
This work demonstrates the ability of the NexION® 2200 ICP-MS to reliably and effectively quantify ultra-trace impurities at the ng/L level in concentrated HCl.
Metallic Impurity Analysis in CO Gas by Direct Injection ICP-MS
For improved semiconductor gas analysis, discover how Gas Direct Injection-ICP-MS simplifies sample prep, replacing impingers with direct analysis.
Ultra-Trace Determination of Non-Metallic Elements in Dilute HNO3 by Multi-Quad ICP-MS
For non-metallic impurity analysis in dilute nitric acid, the NexION® 5000 ICP-MS uses a mixed-mode method to achieve low-ppt detection, overcoming spectral interferences.
Drinking water analysis, U.S. EPA Method 200.8
Analysis of drinking water in compliance with the U.S. EPA Method 200.8, Revision 5.4 using the Thermo Scientific iCAP MSX ICP-MS
Comprehensive analysis of different water samples
Comprehensive analysis of water samples in alignment with EN ISO Method 17294 using ICP-MS
Analysis of water, wastewater, and soil samples
Robust analysis of a variety of water, wastewater, and soil samples according to the requirements of U.S. EPA Method 6020B.
Elemental analysis of Soil Samples
This application note demonstrates robust and reliable analysis of soil samples using single quadrupole ICP-MS