Ultra-Trace Elemental Analysis of Semiconductor Solvents by ICP-MS

See how the NexION® 5000 multi-quad ICP-MS offers exceptional performance and interference removal for trace metallic impurities in ultra-pure N-methyl-2-pyrrolidone.

Camston Wrather is transforming waste disposal with sustainable resource recovery from PCBs. Partnering with PerkinElmer, they’ve advanced eco-friendly solutions.

In semiconductor fabrication, controlling impurities is crucial. This work describes metallic nanoparticle analysis in sulfuric acid using the NexION® 5000 SP-ICP-MS.

Explore a method for ultratrace-level quantification of nanoparticle impurities in semiconductor-grade TMAH using NexION® 5000 ICP-MS for improved yield and performance.

This work demonstrates the ability of the NexION® 2200 ICP-MS to reliably and effectively quantify ultra-trace impurities at the ng/L level in concentrated HCl.

For improved semiconductor gas analysis, discover how Gas Direct Injection-ICP-MS simplifies sample prep, replacing impingers with direct analysis.