2D Materials Characterization Using Nanoscale Spectroscopy
This application note describes using complementary s-SNOM and AFM-IR techniques to characterize 2D materials such as graphene, nanoantennae, and semiconductor materials.
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This application note describes using complementary s-SNOM and AFM-IR techniques to characterize 2D materials such as graphene, nanoantennae, and semiconductor materials.
