Damage-Free Failure/Defect Analysis in Electronics and Semiconductor Industries Using Micro ATR FT-IR Imaging
Fourier Transform Infrared Spectroscopy (FTIR) is a non-destructive analytical technique that helps identify and monitor the chemical makeup of almost any material. Using the Agilent Cary 620 chemical imaging system damage-free failure/defect analysis in electronics and semiconductor industries using micro ATR FTIR imaging can be performed.
Finding Education, Mentorship, and Success in Your Spectroscopy Career
January 2nd 2025Seeking opportunities for career growth is important for early-career scientists to explore new skills, connect with mentors, and gain insights into the field. Professional societies and educational programs can be invaluable resources, providing mentorship, training, and networking opportunities that can accelerate career success in spectroscopy.
Raman Microscopy for Characterizing Defects in SiC
January 2nd 2025Because there is a different Raman signature for each of the polymorphs as well as the contaminants, Raman microscopy is an ideal tool for analyzing the structure of these materials as well as identifying possible contaminants that would also interfere with performance.
