Raman microscopy is a powerful technique for identifying the source of forensic samples, such as paint traces. As a non-destructive method of forensic analysis, evidence samples are not compromised during investigation. During forensic investigations, evidence samples are often compared to a database of known specimens for identification. In this Application Note, we show how the RM5 can be used to differentiate between different samples and how spectral library searching allows for the matching of paint samples within seconds.
Polymer Matrices: Optimization for Pre-Analytical Workflow
November 27th 2024Learn about the challenges of preparing polymer samples for elemental analysis and how advanced microwave digestion systems, particularly Single Reaction Chamber (SRC) technology, optimize this process for better accuracy, efficiency, and safety.
Poster Presentation - RISE imaging of various phases of SiC in sintered silicon-carbide ceramics
November 12th 2024In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.