Full SiC Wafer Imaging - Confocal Raman Microscopy for Compositional, Topographic and Mechanical Analysis
Confocal Raman microscopy enables detailed and non-destructive analysis of semiconductors. In the video we present the application of confocal Raman microscopy to analyze material characteristics including doping, stress fields, crystallinity and warpage of a 150 mm (6 inch) silicon carbide (SiC) wafer. To maintain this nanoscale-precision across the macroscopically large x and y dimensions of an entire wafer, we used the WITec alpha300 Semiconductor Edition Raman microscope.
Thermo Fisher Scientists Highlight the Latest Advances in Process Monitoring with Raman Spectroscopy
April 1st 2025In this exclusive Spectroscopy interview, John Richmond and Tom Dearing of Thermo Fisher Scientific discuss the company’s Raman technology and the latest trends for process monitoring across various applications.
A Seamless Trace Elemental Analysis Prescription for Quality Pharmaceuticals
March 31st 2025Quality assurance and quality control (QA/QC) are essential in pharmaceutical manufacturing to ensure compliance with standards like United States Pharmacopoeia <232> and ICH Q3D, as well as FDA regulations. Reliable and user-friendly testing solutions help QA/QC labs deliver precise trace elemental analyses while meeting throughput demands and data security requirements.
