Full SiC Wafer Imaging - Confocal Raman Microscopy for Compositional, Topographic and Mechanical Analysis
Confocal Raman microscopy enables detailed and non-destructive analysis of semiconductors. In the video we present the application of confocal Raman microscopy to analyze material characteristics including doping, stress fields, crystallinity and warpage of a 150 mm (6 inch) silicon carbide (SiC) wafer. To maintain this nanoscale-precision across the macroscopically large x and y dimensions of an entire wafer, we used the WITec alpha300 Semiconductor Edition Raman microscope.
A Seamless Trace Elemental Analysis Prescription for Quality Pharmaceuticals
March 31st 2025Quality assurance and quality control (QA/QC) are essential in pharmaceutical manufacturing to ensure compliance with standards like United States Pharmacopoeia <232> and ICH Q3D, as well as FDA regulations. Reliable and user-friendly testing solutions help QA/QC labs deliver precise trace elemental analyses while meeting throughput demands and data security requirements.
