Confocal Raman microscopy enables detailed and non-destructive analysis of semiconductors. In the video we present the application of confocal Raman microscopy to analyze material characteristics including doping, stress fields, crystallinity and warpage of a 150 mm (6 inch) silicon carbide (SiC) wafer. To maintain this nanoscale-precision across the macroscopically large x and y dimensions of an entire wafer, we used the WITec alpha300 Semiconductor Edition Raman microscope.
Streamlining Food & Feed Pre-Analytical Workflows for Metals and Fat Determination
January 8th 2025A focus on optimizing sample preparation in food and feed analysis can improve laboratory efficiency, data quality, and compliance with regulatory standards. Innovations like advanced microwave digestion and automated reagent handling can streamline workflows, improve safety, and ensure reliable analyses, ultimately supporting overall food safety.