Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Improving Fluorescence and Raman Techniques for Environmental Microplastic Analysis
March 31st 2025A recent study conducted at the LaserLaB Amsterdam and Vrije Universiteit Amsterdam (the Netherlands) explored spectroscopic imaging techniques, including Raman and fluorescence microscopy, for characterizing microplastics (MPs), focusing on optimizing sample preparation, particularly density separation, and Nile Red staining.Spectroscopy spoke to Merel Konings, corresponding author of the paper resulting from the study, about her work
New Study Provides Insights into Chiral Smectic Phases
March 31st 2025Researchers from the Institute of Nuclear Physics Polish Academy of Sciences have unveiled new insights into the molecular arrangement of the 7HH6 compound’s smectic phases using X-ray diffraction (XRD) and infrared (IR) spectroscopy.