Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Previewing Photonics West Keynote Sessions on Phototherapy and Fourier Ptychographic Microscopy
January 28th 2025The editors of Spectroscopy provide a compilation of talks that spectroscopists should consider attending on Tuesday January 28th during the Photonics West Conference in San Francisco, California.
Measuring Freshness of Salmon with Handheld Spectroscopic Instruments
January 27th 2025To better determine fish freshness within the context of rapid spectroscopic analyses, salmon fillet was analyzed via hand-held fluorescence and absorption spectroscopy devices across the visible and near-infrared (vis-NIR) range and benchmarked against industry-standard potentiometry and the gold-standard laboratory procedure, nucleotide extraction assays, over a 11-day period.