Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Breaking Spectral Boundaries: New Ultrafast Spectrometer Expands Detection Range for NIR Studies
October 29th 2024A team from Auburn University has developed an innovative ultrabroadband near-infrared (NIR) transient absorption (TA) spectrometer capable of detecting across a wide spectral range of 900–2350 nm in a single experiment. This advancement improves the study of ultrafast processes in low-bandgap materials and opens doors to new insights in photochemistry and charge dynamics.