Identifying Contamination in Trace Metal Laboratories
Ralph H. Obenauf and Nimi Kocherlakota, Spex CertiPrep, Inc.
Articles in this issue
Performance of Electron Multipliers in High-Pressure Applications
Quantitative Analysis of Low Levels of Chlorine and Iron in Hydraulic Oil Samples
Low-Frequency and Stokes-Antistoke Raman Measurements Using TriVista
The Impact of Spatial Sampling Density in Raman Imaging
RoHS/WEEE Application of a Miniature X-Ray Spectrometer
Principle Component Analysis of Urine Samples Based upon ESI-TOF-MS Data
Low-Level Speciation of Chromium in Drinking Waters Using LC-ICP-MS
Differentiation of Hydrocarbon Homologs Using EP-IR Spectroscopy
Confocal Raman Microscopy-Imaging in Pharmaceutical Research
Determination of Absolute Configuration
Secondary Structure Analysis of Proteins Using IR Imaging
Measurement of the Spectroscopic Properties of Optical Components for CD-DVD Players Using the Microsample Measurement Accessory
Microsampling of Low-Concentration Aqueous Proteins Using a Novel Hydrophobic Sampling Device and the uMax Sample Compartment Infrared Microscope
Continuous Infrared Monitoring of Organic Pollutants in Industrial Wastewater
Differentiation of Hydrocarbon Homologs Using EP-IR Spectroscopy
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