Metallic Impurities in Silicon Wafers
This work demonstrates the coupling of an IAS Expert_PS VPD system with the NexION® 5000 Multi-Quadrupole ICP-MS for determination of metallic impurities in Si wafers.
Poster Presentation - RISE imaging of various phases of SiC in sintered silicon-carbide ceramics
November 12th 2024In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.
FT-IR gas analysis of coal-to-ethylene glycol process
October 31st 2024Coal-to-ethylene glycol is the process by which ethylene glycol is synthesized from coal instead of traditional methods using petroleum as the raw material. This study demonstrates that Fourier Transform Infrared Spectroscopy (FT-IR) can be a reliable alternative to simultaneously measure methyl nitrite and other process gases (such as CO and NO) using a single ABB analyzer.
Sensi+, fast, accurate and reliable monitoring of H₂S, H₂O and CO₂ in natural gas
October 31st 2024Sensi+ is a compact natural gas contaminants analyzer based on a unique tunable diode laser (TDL) technology called Off-Axis Integrated Cavity Output Spectroscopy (OA-ICOS™). The technology accurately, reliably, and simultaneously measures corrosive substances such as hydrogen sulfide, carbon dioxide and water in real-time within complex and time-varying natural gas streams. Mitigating the risks and effects of contaminants in natural gas can be challenging for pipeline operators, process industries, and natural gas utilities. These companies must manage various technologies and devices to achieve a comprehensive analysis, which can be complex, prone to failure, and costly. ABB's revolutionary Sensi+™ analyzer answers these issues.
