Monitoring UV-Cured Adhesion in Semiconductor Assembly (Oct 2023)

Learn about the challenges of preparing polymer samples for elemental analysis and how advanced microwave digestion systems, particularly Single Reaction Chamber (SRC) technology, optimize this process for better accuracy, efficiency, and safety.

This study provides an overview of correlative Raman imaging, PL and topographic analyses of compound semiconductors used to characterize composition and defects.

See Raman imaging investigate living cell components & plant cell walls, recognize atherosclerosis, differentiate malignant cells, monitor lipid uptake, and much more.

This work demonstrates the ability of PerkinElmer's Avio® 550 Max ICP-OES to provide highly accurate determinations of major components in hemodialysis solutions

In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.