Reflectance Measurements of Materials Used in the Solar Industry

Our GoldenEye is the only Snapshot hyperspectral imager covering from 400-1100nm.

XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.

By adding a FLIM module to the inVia Raman microscope, you can directly correlate Raman and fluorescence lifetime images with ease.

This work describes Raman and IR spectroscopies as a viable means of comparing CO2 concentrations.

In this application note, we use a compact, high-resolution spectrometer to investigate the reflectance properties of graphite samples in powder form.

In this application note, we evaluate the effectiveness of a modular spectrometer for measuring the absorbance of optical filters and potassium dichromate standards.