Surface Sensitive Photothermal AFM-IR Unlocks New Dimensions in Precision Analysis for Top Layer of Sample
Bruker’s Surface Sensitive AFM-IR technology provides high-resolution surface sensitivity, reducing chemical probing depth to under 30 nanometers.
New Study Provides Insights into Chiral Smectic Phases
March 31st 2025Researchers from the Institute of Nuclear Physics Polish Academy of Sciences have unveiled new insights into the molecular arrangement of the 7HH6 compound’s smectic phases using X-ray diffraction (XRD) and infrared (IR) spectroscopy.
A Seamless Trace Elemental Analysis Prescription for Quality Pharmaceuticals
March 31st 2025Quality assurance and quality control (QA/QC) are essential in pharmaceutical manufacturing to ensure compliance with standards like United States Pharmacopoeia <232> and ICH Q3D, as well as FDA regulations. Reliable and user-friendly testing solutions help QA/QC labs deliver precise trace elemental analyses while meeting throughput demands and data security requirements.
