Spectroscopy-07-01-2008

Volker Thomsen takes a look at the impact that the discovery of X-rays by Wilhelm Röntgen in 1895 has had on the world.

Surface-enhanced Raman spectroscopy (SERS) has experienced an explosive resurgence in interest lately. Development of reproducible, spatially uniform SERS-active substrates has made this technique an attractive approach for identification of Raman-active compounds and biological materials including toxins, intact viruses, and intact bacterial cells–spores...

Columnist Bob McDowall discusses the role of a validation master plan (VMP) for summarizing a laboratory's approach to computer validation.

Hitachi introduces two new versions of the U-4100 UV-Vis-NIR Spectrophotometer: the Standard Solid Sample System and Large Solid Sample System. These new systems use PMT and InGaAs detectors, providing increased sensitivity in the range of 850–1700 nm. This results in reduced noise, making the instrument suitable for the measurement of low transmitting/reflecting anti-reflection coatings.

In the fourth part of a five-part series, columnist Ken Busch discusses factors that might cause deviation from linearity at the upper and lower limits of a calibration curve.

X-ray fluorescence spectroscopy (XRF) is one of the primary analytical tools used in the cement industry for a variety of related applications. The principle of XRF is relatively simple; a source directs X-rays onto the atoms of the sample, ejecting electrons from the inner electron shells.

A preview of the 57th Annual Denver X-Ray Conference, to be held August 4–8 in Denver, Colorado.