Amptek, Inc., is a recognized world leader in the design and manufacture of state-of-the-art X-ray and gamma ray detectors, preamplifiers, instrumentation, and components for portable instruments, laboratories, satellites, and analytical purposes. These products provide the user with high performance and high reliability together with small size and low power.
X-ray fluorescence (EDXRF), direct spectral measurements, EDS XRF, PIXE, and TXRF.
Amptek serves wherever X-ray detection is used; for example, hand-held and table-top XRF analyzers produced by OEMs; research facilities in universities, commercial enterprises and the military; nuclear medicine; space; museums; environmental monitoring; and geological analysis of soils and minerals.
Amptek recently brought silicon wafer manufacturing in-house and improved the process. The results are detectors with lower noise, lower leakage current, better charge collection, and uniformity from detector to detector.
The FAST SDD® represents Amptek's highest performance silicon drift detector (SDD), capable of count rates over 1,000,000 CPS (counts per second) while maintaining excellent resolution. The FAST SDD® is also available with our Patented C-Series (Si3N4) low energy windows for soft X-ray analysis.
Amptek has developed a 70 mm2 FAST SDD® Detector in a TO-8 package. This is the same package that is used with all Amptek detectors. This makes the 70 mm2 a drop-in replacement (same package, same pin-out, same voltages). Triple the count rate versus the 25 mm2 SDD with the same performance.
Also offering improved performance are Amptek's SDD and Si-PIN detectors.
Amptek detectors are offered in a wide range of configurations with their Preamplifiers and Digital Pulse Processors (DPP) for complete XRF portable solutions.
Amptek, Inc.
14 DeAngelo Drive
Bedford, MA 01730
TELEPHONE
(781) 275-2242
FAX
(781) 275-3470
E-MAIL sales@amptek.com
WEB SITE www.amptek.com
NUMBER OF EMPLOYEES
47
YEAR FOUNDED
1977
FT-IR Analysis of pH and Xylitol Driven Conformational Changes of Ovalbumin–Amide VI Band Study
November 21st 2024This study uses Fourier transform infrared (FT-IR) spectroscopy to analyze how the globular protein ovalbumin's secondary structures transition under varying pH conditions in the presence of the cosolvent xylitol, highlighting the role of noncovalent interactions in these conformational changes.