Automated Analysis of Trace Elemental Impurities in IPA
This study demonstrates how to measure ultratrace (parts-per-trillion) levels of inorganic impurities in isopropyl alcohol, a key process chemical for semiconductor fabrication. The method includes online calibration using the IAS Automated Standard Addition System for an Agilent ICP-QQQ instrument. The method allows the accurate and reliable quantification of ultratrace level impurities in IPA without requiring a highly skilled analyst.
Poster Presentation - RISE imaging of various phases of SiC in sintered silicon-carbide ceramics
November 12th 2024In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.
FT-IR gas analysis of coal-to-ethylene glycol process
October 31st 2024Coal-to-ethylene glycol is the process by which ethylene glycol is synthesized from coal instead of traditional methods using petroleum as the raw material. This study demonstrates that Fourier Transform Infrared Spectroscopy (FT-IR) can be a reliable alternative to simultaneously measure methyl nitrite and other process gases (such as CO and NO) using a single ABB analyzer.
