Spectroscopy magazine is seeking contributed manuscripts for its August 2014 supplement on Fourier transform-infrared (FT-IR) spectroscopy. This supplement will include explanations of fundamentals of FT-IR spectroscopy, along with discussions of recent advances in the technology and applications-oriented articles.
Spectroscopy magazine is seeking contributed manuscripts for its August 2014 supplement on Fourier transform-infrared (FT-IR) spectroscopy. This supplement will include explanations of fundamentals of FT-IR spectroscopy, along with discussions of recent advances in the technology and applications-oriented articles.
Links to our past supplements appear below:
Manuscripts should be approximately 2,000-2,500 words long, plus figures and tables as needed, including an abstract of approximately 150-200 words. Applications articles should follow a standard experimental article format. Figures and tables, along with their captions, should appear at the end of the manuscript, and figures also must be sent as separate files, preferably in JPG, TIF, PNG, or XLS format. References should be called out using numbers in parentheses and listed at the end of the manuscript in numerical order.
Submissions from equipment manufacturers will be considered but must be devoid of promotional content; discussions of new technology should not focus on a specific manufacturer’s instrument.
Complete author guidelines are available at the following link:
Due date for abstract submission: May 19, 2014
Due date for completed articles: June 27, 2014
Suggested article length: ~2000–2500 words, plus figures and tables as needed
Where to submit: Send all proposals and completed articles to Editor Laura Bush, at [email protected] (tel. +1.732.346.3020).
The Big Review III: Molecular Vibration Theory
January 2nd 2025It has occurred to me that, in the 10+ years I have been writing about molecular vibrations, I have never introduced my readers to its basic theory! I will rectify that now. Some of this is new material, and some will be review. Either way, it is important that all this material be covered in one place.
Raman Microscopy for Characterizing Defects in SiC
January 2nd 2025Because there is a different Raman signature for each of the polymorphs as well as the contaminants, Raman microscopy is an ideal tool for analyzing the structure of these materials as well as identifying possible contaminants that would also interfere with performance.
ICP-MS Highlights: A Spectroscopy Year in Review
December 28th 2024Reflecting on 2024, the editors of Spectroscopy highlight some of the most notable articles and online content on inductively coupled plasma mass spectrometry (ICP-MS) and inductively coupled-optical emission spectroscopy (ICP-OES).