Measuring thickness and optical constants of transparent films on transparent substrates can be a challenge for spectroscopic ellipsometry. The sensitivity of the HORIBA UVISEL ellipsometer allows this challenging task to be easily performed.
Best of the Week: Exclusive on Flow Imaging Microscopy, Interview with PNNL Chief Science Officer
April 4th 2025Top articles published this week include several interviews with key opinion leaders on various topics including advanced mass spectrometry (MS) technologies in studying diseases, microplastic detection, and interpreting Raman spectra.
New Multi-Spectroscopic System Enhances Cultural Heritage Analysis
April 2nd 2025A new study published in Talanta introduces SYSPECTRAL, a portable multi-spectroscopic system that can conduct non-invasive, in situ chemical analysis of cultural heritage materials by integrating LIBS, LIF, Raman, and reflectance spectroscopy into a single compact device.