Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
This Agilent application note discusses the Cary 7000 UMS, a system for mapping coated wafers using UV-Vis spectral reflection and transmission measurements. It introduces a new autosampler for automated, high-resolution mapping of large samples and demonstrates its utility with a zinc tin oxide layer on a sapphire substrate.
Identifying Raw Materials Inside Containers with Vaya
October 11th 2024The Agilent Vaya Raman system is a handheld spectrometer capable of identifying raw materials through transparent and opaque containers. This white paper discusses some of the benefits of deploying a Vaya system in a pharmaceutical warehouse, to simplify and accelerate the ID verification of raw materials at receipt.
Opaque Container Analysis Capabilities of the Agilent Vaya
October 11th 2024This study demonstrates the through-opaque-container analysis capability of the Agilent Vaya handheld Raman spectrometer by performing measurements on a range of common excipients and active ingredients within blue barrels.
