DXC 2006: The World's Leading Forum for X-Ray Materials Analysis
Spectroscopy previews all of the events and happenings at the 55th Annual Denver X-Ray Conference, to be held August 7-11 in Denver, Colorado.
The 55th Annual Denver X-Ray Conference on Applications of X-Ray Analysis, sponsored by the International Centre for Diffraction Data (ICDD), will be held from August 7 to August 11, 2006, at the Denver Marriott Tech Center Hotel in Denver, Colorado. In addition to the conference events, the beautiful Mile High City offers something for everyone: sporting events; great dining; a collection of museums, galleries, and shopping; and more.
The Denver X-Ray Conference (DXC) is the world's leading forum for scientists in the field of X-ray materials analysis. The conference provides sessions on training, education, and applications that will appeal to both newcomers in the field and those with many years of experience. Another exciting part of the DXC is the presence of leading manufacturers of X-ray equipment, who will be exhibiting their latest devices and answering technical questions.
Members of the Denver X-Ray Conference Organizing Committee help to ensure that the technical program remains commercial free and that the sessions and workshops address the needs of the attendees. Workshops are run by experts in X-ray diffraction (XRD) and X-ray fluorescence (XRF), who provide training on the many practical applications of these techniques and will be available to answer attendees' questions.
Workshops
Here is a brief outline of the workshops being offered at this year's DXC:
XRD
Specimen Preparation XRD
Rietveld Applications I—Beginner
Rietveld Applications II—Advanced
High Resolution XRD
Basic Crystallography
New Generation of XRD Databases—Capabilities and Applications I & II
XRF
Specimen Preparation XRF I & II
Trace Element Analysis
Basic XRF
Quantitative Analysis I & II
EDXRF
XRD & XRF
Microbeam X-ray Characterization I & II
Plenary Session
The Plenary Session on Wednesday, August 9, is titled "Medical Applications of X-ray Analysis." The following are the invited papers to be presented during this session:
MEDICAL APPLICATIONS OF X-RAY FLUORESCENCE: A STATUS REPORT RELATED TO TRACE ELEMENT RESEARCH
J. Börjesson, Department of Diagnostic Radiology, County Hospital (Halmstad, Sweden)
S. Mattsson, Department of Radiation Physics, Malmö University Hospital (Malmö, Sweden)
IN VIVO MEASUREMENT OF TOXIC ELEMENTS USING X-RAY FLUORESCENCE ANALYSIS
F.E. McNeill, D.R. Chettle, L. Nie, M. Popovic, R.C.N. Studinski, McMaster University (Hamilton, Ontario, Canada)
J.M. O'Meara, University of Guelph (Guelph, Ontario, Canada)
A REVIEW: XRF ANALYSIS OF Pb IN BONE
P. Wobrauschek, Atominstitut, Vienna University of Technology (Vienna, Austria)
CANCER DIAGNOSIS USING SAXS IMAGING
K.D. Rogers, S. Wilkinson, A. Round, Cranfield University (Wiltshire, UK)
C.J. Hall, Daresbury Laboratory (Cheshire, UK)
Presentation of Awards
The 2006 Birks Award will be presented to Peter Wobrauschek, Atominstitut, Vienna University of Technology (Vienna, Austria). It will be presented by M.A. Zaitz, IBM (Hopewell Junction, New York).
This year's Jerome B. Cohen Student Award will be announced at the plenary session and is scheduled to be presented by I.C. Noyan, Columbia University (New York, New York).
Finally, the 2006 Hanawalt Award will be presented to Peter Wallace, Dos Arroyos Enterprises (Oro Valley, Arizona), by J.A. Kaduk, Innovene USA LLC (Naperville, Illinois).
Oral Sessions
XRD & XRF Topics
New Developments in XRD & XRF Instrumentation
In-Situ Characterization
Thin Films
X-ray Optics
Detectors & Sources
Environmental & Archaeological Applications
XRD Topics
Structure Solution & Refinement
Applications of High-Energy X-rays
Industrial Applications of XRD
Stress Analysis
XRF Topics
Quantitative XRF
New Developments in Instrumentation and Industrial Applications of XRF
Trace Analysis
Fusion Applications
Posters
XRD Poster Session
Instrumentation
A New Tensile Stage for In-Situ X-ray Scattering Experiments Combined With Mechanical Tests
Automatic Sample Height Correction for Non-Ambient Experiments
Usage of an Advanced Fullpat Method To Quantify Amorphous Material
Performance and Industrial Studies at the New Neutron Residual Stress Mapping Facility
First Experiment of a Structural Studies Beamline BL15 of a Compact Synchrotron Light Source (SAGA-LS) Newly Constructed With High Cost Performance
DHS1100—A New High Temperature Attachment for Multipurpose 4-Circle X-ray Goniometers
Microdiffraction With a New Intensified CCD Camera and Focusing Monocapillary Optic on a Conventional Powder Diffractometer
Transmission X-ray Powder Diffraction With a Confocal Graded D-Spacing Mirror Optic—A New Technique for Deposited Thin Films and Capillary Samples
Analysis of Very Small Samples With a Pseudoparallel Geometry Diffraction System
Grazing Incidence
Analysis of Low Mass Absorption Materials Using Glancing Incidence X-ray Diffraction
Anomalous Scattering From Single Crystal Substrate
An Analysis of the Stress Distribution Based on Measurements Carried Out Using X-ray Incidence Method
Stress
X-ray Diffraction Measurement for Characterization of Energetic Materials
X-ray Characterization of WC Surface Coatings
The Comparative Investigations of Surface Residual Stresses in Steel After Static and Cyclic Deformation
"Galaxy XRD"—Inspection of Single Crystal Turbine Blades
Analysis and Evaluation on Residual Stress of Fine Grain Steel Using X-ray
Shot Peening Efficiency for Fine Grain Steel
Residual Stress State of Hydroxyapatite Graded Coating on Ceramic Substrate
Rapid Determination of Stress Factors and Residual Stresses in Anisotropic Thin Films
Texture Changes in Cyclically Deformed Cellulosics Characterized by In-Situ Synchrotron Diffraction Coupled With Tensile Tests
Stress Mitigation of X-ray Beamline Monochromators Using Topography Test Unit
Determination of Poisson's Ratio and Young's Modulus of Nitride Thin Films
In-Situ
High Temperature X-ray Diffraction Analysis of Defense Waste Processing Facility Glass Frits
Size Effect in Metallic Thin Films Characterized by Low-Temperature X-ray Diffraction
Temperature Accuracy in High Temperature XRD—Influencing Factors and Calibration
Neutron and Synchrotron Structure Evaluation of Li3N During Hydriding and Dehydriding
High Temperature Diffraction to Develop Solid Oxide Fuel Cell Sealing Glasses
Miscellaneous
A Method for Cell Gap Measurement of Reflective Twisted Nematic Liquid Crystal Display
An EXAFS Study of Photographic Development in Photothermographic Films
Correcting for Microabsorption—Brindley Revisited
Radiation Damage in Powder Samples Prepared With Binder
Characterization and Optical Properties of CdS:Cu Nanocrystals Prepared by Chemical Synthesis
Influence of Samarium on the Crystal Structure and Microstructure of Photolumescent SrTiO3
Rietveld Analysis: Choosing X-ray Powder Diffraction Data Obtained From Parallel and Focusing Beam Geometry
Interactive Data Language Visualizations and Calculations From Full Datasets
Unit Cell Expansion in ErT2 Films
Capturing and Shaping X-rays With Free-Form Multilayer Optics
Quantitative XRD Analysis for Process Control at Aluminum Smelters
XRF Poster Session
Applications
Non-Destructive Analysis of a Painting, National Treasure in Japan
X-ray Phase-Contrast Tomography of Malaria Transmitting Mosquitoes for Morphology Studies
Determination of Low Z Elements With TXRF in Biofilms Directly Cultivated on Quartz Carrier Plates
Lead in Human Cartilage: Imaging and Speciation by Micro-XRF and Micro-XANES
Carbon Nanotube Elemental Char-acterization Using Micro X-ray Fluorescence
Arsenic Speciation in Cucumber (Cucumis sativus L.) Xylem Sap by K-Edge TXRF-XANES
Non-Destructive EDXRF Analysis of Archaeological Samples
Instrumentation
Design of a Borehole XRF Spectrometer for the Mars Regolith
Portable XRF System Including Light Element Analysis With Polycapillary Optics for the Investigation of Art Objects
Benchtop WDXRF Ultra-Low Sulfur Analyser for Fuel Oil
Application of Total Reflection Mirrors for Radiation Gathering Improvement of X-ray Planar Waveguide-Resonator
Analytical Application of Multilayer X-ray Optics
Quantitative
The Ratio of Lines Intensities as an Analytical Parameter in XRF
Estimating the Hydrocarbon or Oxide Fraction of Bulk Samples Using Scattered Radiation
Exhibits
In addition to attending the programs being presented at the DXC, conference participants will have the opportunity to visit the Columbine Center on the ground floor of the hotel to see the exhibits being presented by some of the leading manufacturers in the field. A diagram of the exhibit locations will be available in the Book of Abstracts and on the DXC web page.
Exhibit Hours:
Monday 10:00 a.m.–5:00 p.m.
Tuesday 10:00 a.m.–5:00 p.m.
Wednesday 10:00 a.m.–5:00 p.m.
Thursday 10:00 a.m.–2:00 p.m.
For more information and to register on-line, see the Denver X-ray Conference web page at http://www.dxcicdd.com. The information contained in the program is current as of the printing date.
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