|Articles|March 19, 2015
Imaging of Graphene with Combined Raman-AFM, SNOM, Nearfield-Raman, and Raman-SEM (RISE)
Author(s)WITec GmbH
Raman, AFM and SEM imaging provide information regarding the characterization of chemical and structural properties. In this application note you will gain an overview of the WITec imaging techniques through various application examples from graphene research.
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