Moxtek is a leading supplier of advanced nano-optical and X-ray components used in display electronics, imaging, and analytical instrumentation. Moxtek provides innovative, solution-based products and services focused on performance, quality, and value. Moxtek products enable many new scientific discoveries and improve the quality of everyday life.
Moxtek optical polarizers and polarizing beamsplitters enable advancements in projection display and analytical instrumentation including: 2-D and 3-D projection display, near-eye display, and optical analysis instrumentation.
Moxtek X-ray products empower compact handheld and benchtop elemental analysis for positive material identification. Moxtek products are used in various EDXRF, WDXRF, and XRD systems for environmental screening, hazardous substance analysis, and sorting and recycling.
Moxtek
452 West 1260 North
Orem, UT 84057
TELEPHONE
(801) 225-0930
FAX
(802) 221-1121
E-MAILinfo@moxtek.com
WEB SITEwww.moxtek.com
New Spectroscopic Techniques Offer Breakthrough in Analyzing Ancient Chinese Wall Paintings
October 29th 2024This new study examines how spectroscopic techniques, such as attenuated total reflection Fourier transform infrared spectroscopy (ATR FT-IR), ultraviolet–visible–near-infrared (UV-Vis-NIR) spectroscopy, and Raman spectroscopy, were used to analyze the pigments in ancient Chinese wall paintings.
Breaking Spectral Boundaries: New Ultrafast Spectrometer Expands Detection Range for NIR Studies
October 29th 2024A team from Auburn University has developed an innovative ultrabroadband near-infrared (NIR) transient absorption (TA) spectrometer capable of detecting across a wide spectral range of 900–2350 nm in a single experiment. This advancement improves the study of ultrafast processes in low-bandgap materials and opens doors to new insights in photochemistry and charge dynamics.
FT-NIR and Raman Spectroscopic Methods Enhance Food Quality Control
October 28th 2024A recent study showcases the potential of Fourier transform near-infrared (FT-NIR) spectroscopy and spatially offset Raman spectroscopy (SORS) in detecting raw material defects in hazelnuts caused by improper storage conditions. FT-NIR spectroscopy proved especially effective, while SORS offered complementary insights in certain scenarios. These spectroscopic methods could modernize the speed and accuracy of hazelnut inspections in the food industry.