Optical Characterization of Thin Films Using a Universal Measurement Accessory for Agilent Cary UV-Vis-NIR spectrophotometers
This Agilent application note details the use of a Cary 5000 UV-Vis-NIR spectrophotometer with a universal measurement accessory for the optical characterization and reverse-engineering of thin films. It emphasizes the importance of multi-angle spectral photometric data in assessing the optical parameters of thin films, which is crucial for quality control in manufacturing processes.
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