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Ametek Materials Analysis Division

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Articles

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Improved Sensitivity with the New Apollo XRF ML-50 Detector on the Orbis Micro-XRF Analyzer

Ametek Materials Analysis Division;Bruce Scruggs;Edax, Inc.
February 1st 2013

The measurement of trace elements is important across a wide variety of materials characterization problems. When measuring small glass fragments collected from crime and accident scenes, forensics experts analyze trace strontium (Sr) and zirconium (Zr) typically unintentionally incorporated into the glass during manufacturing as one point of identification or comparison.

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