Bruker Nano

AFM-IR analyzes nanoscale chemical and complex optical properties of 2D materials, including graphene, hexagonal boron nitride, nanoantennae, and semiconductors.

Nanoscale IR spectroscopy combines AFM and IR techniques to enable nanoscale chemical identification of semiconductor materials, specifically those that are organic.

Tapping AFM-IR combines IR spectroscopy and AFM topography mapping to overcome traditional resolution and sample-type limitations to a host of new applications.

Principles of AFM-IR and its application in life sciences, including nanoscale characterization of proteins, structures within single cells, monolayers, and tissues.

Photothermal AFM-IR uniquely provides correlated nanoscale chemical and material property characterization for a wide range of polymeric and thin film samples.

NanoTA is a localized thermal analysis technique that combines the high spatial resolution imaging of AFM with the ability to study thermal behavior of materials.

Combining imaging with broadband spectroscopy provides spatiospectral nanoimaging of 2D materials with nanometer spatial resolution and wide spectral coverage.