WITec Instruments Corp.

True surface microscopy for topographic confocal Raman imaging adds optical profilometer functionality to a highly sensitive confocal Raman microscope. Using this profilometer function, topographic scans of several square millimeters can be acquired, similar to a very large AFM topography image. This acquired large-area topography image can be used to trace the surface contours while acquiring a confocal Raman image.