HHS-US manufactures and integrates world-class silicon drift x-ray detectors (SDDs) for synchrotron applications as well as for use in analytical instruments. Also supports a network of distributors and partner companies that sell and service ED-XRF and Thermal Analysis instruments, which are manufactured by Hitachi High-Tech Science Corp. in Oyama, Japan. This support includes marketing, logistics, service, applications, and sales throughout the Americas.
HHS-US sells detectors in the synchrotron and analytical instrument fields worldwide. Primarily, ED-XRF instruments are used for thin film analysis in the electronics and coatings industries. Thermal analysis applications are many and varied, but our primary users are in the polymer, food, and pharmaceutical industries.
Vortex(r) Silicon Drift Detectors (SDDs) ranging from standard, single element to fully-customize, multi-element designs. The 7000 series of thermal analyzers: DSC7020, DSC7000X, STA7200, STA7300, TMA7000 series, DMA7100 with optional camera systems and other accessories. XRF thin film analyzers: FT110A and F150 series. XRF elemental analysis instruments: EA1000 series, EA1200VX, and EA6000VX.
Vortex manufacturing in our Northridge facility. Instrument manufacturing in Oyama, Japan. Demonstration labs in Dallas, TX, and Northridge, CA, supported by the demo lab in Tokyo, Japan.
Hitachi High-Technologies Science America, Inc.
19865 Nordhoff St.
sales@hitachi-hitec-science.us
www.hitachi-hightech.com/hhs-us
FT-IR Analysis of pH and Xylitol Driven Conformational Changes of Ovalbumin–Amide VI Band Study
November 21st 2024This study uses Fourier transform infrared (FT-IR) spectroscopy to analyze how the globular protein ovalbumin's secondary structures transition under varying pH conditions in the presence of the cosolvent xylitol, highlighting the role of noncovalent interactions in these conformational changes.