Feifei Xie

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Model for Retrieving Leaf Chlorophyll Using the Wavelet Analysis Algorithm with the Prospect Radiative Transfer Model and Vis-NIR Spectra

Feifei Xie;Lin Sun;Jie Wang;Fengzhu Liu
December 2nd 2021

Spectral reflectance is a non-destructive method that is applicable to remote sensing and may be used to measure the chlorophyll content in a crop, which indicates the photosynthetic capacity, growth cycles, and degrees of stress (such as disease, insect infestation, and heavy metal stress) on plant ecosystems. This vis-NIR spectral reflectance method measures leaf chlorophyll using a wavelet analysis algorithm approach.

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