Hiroshi Sugiyama

Polymer laminates typically make complex samples for infrared analysis, comprising multiple layers with defined thicknesses, in some cases less than 10 µm. When measuring extremely narrow laminate layers, the use of attenuated total reflectance (ATR) may provide improved spectra of the laminate cross-section, because ATR microscope objectives offer a greater spatial resolution than transmission due to additional magnification. This paper details the preparation of polymer laminate sample cross-sections and the collection of transmission and ATR spectra of various layers. Further analysis of the laminate spectra will also be explored utilizing a multivariate curve resolution (MCR) algorithm. An example laminate sample is examined utilizing all the tools available on a standard FT-IR microscope.