Dangerous Toys: Rigid Testing Routines Required to Assure Our Children's Safety

This study provides an overview of correlative Raman imaging, PL and topographic analyses of compound semiconductors used to characterize composition and defects.

An interview with Charles Wilkins, the winner of the 2013 American Chemical Society Division of Analytical Chemistry Award in Chemical Instrumentation, sponsored by the Dow Chemical Company.

This work demonstrates the ability of PerkinElmer's Avio® 550 Max ICP-OES to provide highly accurate determinations of major components in hemodialysis solutions

In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.

Spectroscopy sat down with Landulfo Silveira Jr. of Universidade Anhembi Morumbi-UAM and Center for Innovation, Technology and Education-CITÉ (São Paulo, Brazil) to talk about his team’s latest research using Raman spectroscopy to detect biomarkers of cancer in canine sera.