DXC 2007: The World's Leading Forum for X-Ray Materials Analysis
Spectroscopy previews the 56th Annual Denver X-Ray Conference, which will be held from July 30 to August 3 in Colorado Springs, Colorado.
The 56th Annual Denver X-Ray Conference on Applications of X-Ray Analysis (DXC), sponsored by the International Center for Diffraction Data (ICDD), will be held from July 30 to August 3 at the Sheraton Colorado Springs in Colorado Springs, Colorado.
The Denver X-Ray Conference is the world's leading forum for scientists in the field of X-ray materials analysis. The conference provides sessions on training, education, and applications that will appeal to both newcomers in the field and those with many years of experience. Another exciting part of the conference is the presence of leading manufacturers of X-ray equipment, who will be exhibiting their latest devices and answering technical questions.
Workshops
Workshops begin Monday morning, July 30 and continue through Tuesday afternoon, July 31 on the topics of XRD, XRF, and XRD & XRFcombined. These workshops include X-ray Optics, Diffraction Peak Broadening and Peak Shape Analysis, Fundamentals and Applications of Neutron Scattering for Characterizing Structural Materials and Components, Small Angle Scattering, Rietveld Applications I, Rietveld Applications II, X-ray Crystallography without Crystals, Two-dimensional XRD, XRF Sample Preparation I, XRF Sample Preparation II, Trace Analysis, Quantitative Analysis I, Quantitative Analysis II, Basic XRF, Energy Dispersive XRF, and Analysis of RoHS/WEEE Elements—Consultants, Profs, and Testing Labs Take Notice!
Presentation of Awards
2007 Barrett Award presented to Sunil K. Sinha, University of California San Diego, La Jolla, CA
Presented by Cev Noyan, Columbia University, New York, NY
2007 Jenkins Award presented to Ting C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
Presented by John V. Gilfrich, Emeritus, SFA, Inc./NRL,
Silver Springs, MD
2007 Jerome B. Cohen Student Award (winner to be announced at the plenary session)
Presented by Cev Noyan, Columbia University, New York, NY
2007 Distinguished Fellow Award presented to Ting C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
Presented by James A. Kaduk, INEOS Technologies, Naperville, IL
2007 Hanawalt Award presented to T. Ungár, Eötvös University Budapest, Budapest, Hungary
Presented by James A. Kaduk, INEOS Technologies, Naperville, IL
Poster and Plenary Sessions
Poster sessions will take place on July 30 and July 31 from 6pm to 8pm. Oral plenary sessions will take place from August 1 through August 3 at various times.
DXC 2008
DXC 2008 will be held August 4–8 at the Denver Marriott Tech Center Hotel in Denver, Colorado, and take place concurrently with the Eighth International Conference on Residual Stresses. For more information, visit the DXCweb site at www.dxcicdd.com. The information contained in the program is current as of the printing date.
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The Essentials of Analytical Spectroscopy: Theory and Applications
January 23rd 2025This excerpt from The Concise Handbook of Analytical Spectroscopy, which spans five volumes, serves as a comprehensive reference, detailing the theory, instrumentation, sampling methods, experimental design, and data analysis techniques for each spectroscopic region.
