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William F. Meggers: The Dean of American Spectroscopists
Published: April 29th 2024 | Updated: May 10th 2024William Frederick Meggers, honored as the Dean of American Spectroscopists by the US National Bureau of Standards (NBS), dedicated over five decades of his career to NBS, which later became the US National Institute of Standards and Technology (NIST) in 1988 under the United States Department of Commerce. We profile his contributions to spectroscopy here.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.