Olaf Hollricher
Articles
Using confocal Raman imaging and other advanced measurement techniques, we study the localized strain characteristics of tungsten diselenide (WSe2), an important nanomaterial used for optoelectronic device applications.
Criteria for High-Quality Raman Microscopy
June 1st 2019Five key qualitative factors–speed, sensitivity, resolution, modularity and upgradeability, and combinability–contribute to the quality of confocal Raman imaging microscopes. Using application examples, this article introduces modern Raman imaging and correlative imaging techniques, and presents state-of-the-art practice examples from polymer research, pharmaceutics, low-dimensional materials research, and life sciences.
Automated Confocal Raman and Atomic Force Microscopy Imaging of Nanostructured Materials and Devices
June 1st 2008The combination of confocal Raman and atomic force microscopes allows chemical and surface topography imaging of large samples without any ongoing process control by an operator. This article describes the relevant measurement principles and presents examples of automated measurements on nanostructured materials.
Combining Confocal Raman with Atomic force Microscopy for High-Resolution Material Analysis
June 2nd 2005Confocal Raman microscopy can be useful when applied to all samples that are heterogeneous on the micrometer to millimeter scale and that generally can be investigated by Raman spectroscopy. This article presents examples of confocal Raman microscopy from various fields of application including pharmaceutical analysis and stress measurements in semiconductors.
