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Specular Reflectance Spectroscopy with Viewing
September 1st 2013Printed ink on a coated aluminum sample was analyzed using a specular reflectance accessory with the unique capability of simultaneous sample viewing to confidently position the sample. Visual images and spectra of the sample were recorded and stored.
Multi-Wavelength Confocal Raman Microscope for Nondestructive Pharmaceutical Ingredient Analysis
September 1st 2013The characterization of the active pharmaceutical ingredient (API) and its distribution and physical properties in commercial medicine is necessary in drug research and development process in the pharmaceutical industry.
Wire Grid Polarizers for IR Spectroscopy
September 1st 2013Broadband wire grid polarizer (WGP) products suitable for MWIR and LWIR (mid- and long-wavelength infrared) spectroscopic applications requiring high contrast were developed on thin, AR-coated silicon substrates using Moxtek wafer-scale aluminum Nanowire? patterning capabilities. The Moxtek WGP performance was characterized from the SWIR to LWIR and shows marked improvement over competing WGP products, especially in terms of the contrast ratio between passing and blocking state polarizer transmittance.
Depth Profiling of Complex Samples Using Confocal Raman Microscopy
September 1st 2013Raman microscopy has evolved into a common method for fast and non-destructive analysis of microscopic samples in forensic and R&D laboratories as well as for troubleshooting in the field of quality control. Samples ranging from art & archeology, materials science, biology, pharmacology to polymers and plastics can be investigated.
Identification of Explosives with Handheld Raman Spectroscopy and an Innovative Sampling Technique
September 1st 2013A novel optical focusing method overcomes sampling hurdles associated with Raman devices that are based on a dispersive design. Raster Orbital Scanning (ROS) samples the target materials while maintaining high resolution and minimizing the power buildup of a tightly focused laser typical in Raman applications.
Single Reaction Chamber Microwave Digestion for Specialty Chemicals
February 1st 2013Single reaction chamber microwave digestion enables a chemist to digest up to 15 different specialty chemical samples simultaneously at temperatures as high as 300 ?C, greatly simplifying the workflow while maintaining superior quality digestions.
The miniDOAS: Low Cost, High Performance Contactless Ammonia Measurements
Knowledge of atmospheric ammonia concentrations is important, but ammonia is difficult to measure. We report here on the development of a low-cost ammonia measuring differential optical absorption spectroscopy (DOAS) instrument, based on a small sized and low priced spectrograph.
Microwave Digestion of Pharmaceutical Samples for USP Method
February 1st 2013Pharmaceutical samples spiked with several heavy metals were prepared for ICP-MS analysis using microwave digestion following the protocols in proposed USP chapters <232> and <233>. The results of the spike recovery study are discussed.
Non-Destructive Red Wine Measurement with Dispersive 1064 nm Raman Spectroscopy
February 1st 2013Owing to technological improvements spurred on by the telecommunications boom of the last decade, Raman spectroscopy has become much more accessible to users in all application areas, including agricultural, forensic, pharmaceutical, biomedical, and others.
Eliminating the Trade-Off Between Resolution and Throughput in Raman Spectroscopy
February 1st 2013Although Raman spectroscopy is an excellent analytical tool, Raman signals are often weak and traditional slit spectrometers typically have poor optical throughput, limiting their effectiveness in low light level setups.
Moxtek's ULTRA-LITE X-ray Source
February 1st 2013Moxtek's ULTRA-LITE X-ray source is a very small self contained X-ray source (X-ray tube and high voltage power supply) for use in portable X-ray applications, such as the handheld X-ray fluorescence (XRF) spectrometers. This note demonstrates that this X-ray source has a stable and repeatable X-ray flux output over time, which is vital for the precision of the calibrated XRF measurements.
Improved Sensitivity with the New Apollo XRF ML-50 Detector on the Orbis Micro-XRF Analyzer
February 1st 2013The measurement of trace elements is important across a wide variety of materials characterization problems. When measuring small glass fragments collected from crime and accident scenes, forensics experts analyze trace strontium (Sr) and zirconium (Zr) typically unintentionally incorporated into the glass during manufacturing as one point of identification or comparison.