Lisa M. Ganster

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Enhanced Raman Reflection Spectroscopy for Process Analytical Technology

Kaiser Optical Systems Inc;Lisa M. Ganster;Karen Esmonde-White;Ian R. Lewis

February 17th 2016

A novel approach in Raman spectroscopy enables bulk material analysis without the need for specialized equipment. Enhanced Raman reflection can be integrated into current processes using available instrumentation, enabling real-time process measurement and control.

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