Application Notes: General
Analysis of Impurities in Silver by Spark Ablation Sampling, Combined with ICP-OES
February 1st 2009A method for the determination of elemental impurities in solid silver samples was developed using a spark ablation accessory in combination with ICP-OES. Detection limits at the sub-ppm level were achieved along with good accuracy and precision.
The New Orbis Micro-XRF Analyzer Series
February 1st 2009Building on more than 10 years of Micro-XRF experience, the Orbis spectrometer yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret integrating video and X-ray optics allowing coaxial sample view and X-ray analysis. The turret can accommodate two additional collimators along with the X-ray optic for a total of three X-ray beam sizes to expand the Orbis analytical capabilities beyond traditional Micro-XRF analysis. Primary beam filters can be used with all spot sizes available on the turret to allow true XRF analytical capabilities in a micro-spot analysis. The working distance is increased to allow analysis over rougher sample topography without sacrificing signal intensity.
Complete Analysis of Carbon Black–Containing Rubbers
September 1st 2008Carbon black rubbers often contain multiple components, but are strongly absorbing in the infrared. The combination of Ge ATR, Advanced ATR correction and multi-component searching permits the full analysis of these important materials.
Miniature NIR: Improved Accuracy, Cost Savings
September 1st 2008With gas and diesel fuel prices rising, there is an increasing need to monitor online quality control and blending mixtures. The benefits include improved accuracy in blending mixtures, solid state reliability, lifetime calibration and fraud avoidance.
Monitoring Cure Characteristics of a Thermoset Epoxy by ATR/FT-IR
September 1st 2008Some ATR / FTIR applications require a high performance, robust, and versatile accessory to accommodate difficult materials or high temperatures. As an example, the curing of a thermoset epoxy is evaluated and results are discussed.
Simplifying Measurement of D/H and 18O/16O Isotopic Ratios from Liquid Water by WS-CRDS
September 1st 2008Wavelength-Scanned Cavity Ring Down Spectroscopy combines the real-time speed and turnkey simplicity of optical spectroscopy with the precision (<0.1 δ18O [‰], < 0.5 δD [‰]) previously only available from complex IRMS systems.
Ultrafast and Automated Confocal Raman Imaging on Large Samples
September 1st 2008In the Life Sciences, Materials Research, and Nanotechnology, obtaining as much information as possible about the chemical and structural composition of a sample is essential. Confocal Raman Microscopy can play an important role in the nondestructive characterization and imaging of chemical properties while requiring only minimal, if any sample preparation. Systematic and routine research tasks with repetitive experiments or a large number of measurement points, as well as high-level quality control can benefit from an automated instrument.
Economical Maya2000 Pro Extends to VUV
September 1st 2008Spectral measurements down to 153 nm can be achieved easily and economically with the high-sensitivity Maya2000 Pro with Extra-Deep-UV Option. Nitrogen purging of the spectrometer helps to mitigate water and oxygen absorption in the vacuum ultraviolet.
Microelectroluminescence Characterization of Single Quantum Dots
September 1st 2008Semiconductor quantum dots (QDs) can be used as nonclassical light sources with applications in next-generation quantum communication and computing. Electrically pumped QDs are all solid-state sources of single photons that are not limited by Poisson statistics (1). Recent work by the group of Dieter Bimberg at Technische Universität-Berlin has demonstrated the selective pumping of a single InAs QD with emission from a single exciton (1–3).
Advantages of Silicon Drift Detectors
September 1st 2008The availability of new silicon drift detectors (SDD) allows for more precise measurements in less acquisition time. SDDs are often praised for their excellent energy resolution, but it is their increased throughput that make them ideal for many industrial applications. Due to the detector's smaller capacitance, a much shorter peaking time is used in the shaping amplifier without sacrificing resolution. This dramatically increases the throughput of the system. Compared with a conventional Si-PIN detector where the peaking time is as long as 25 ms, the drift detector operates at 1.6 ms, thereby increasing throughput from 10,000 counts per second to over 100,000. This advantage can be used in two primary ways.